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http://localhost:7000/xmlui/handle/123456789/785Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Selman, Joseph. | - |
| dc.date.accessioned | 2018-08-07T09:43:20Z | - |
| dc.date.available | 2018-08-07T09:43:20Z | - |
| dc.date.issued | 1954 | - |
| dc.identifier.uri | http://hdl.handle.net/123456789/785 | - |
| dc.description | Acc no. H701, xii, 340p.; ill. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | Springfield Charles C Thomas | en_US |
| dc.subject | Electron Microscopy | en_US |
| dc.subject | X-Rays | en_US |
| dc.subject | Electron Radiogrphy | en_US |
| dc.subject | Modern physics | en_US |
| dc.title | The Fundamentals of X-Ray and Radium Physics | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | 530 Physics | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| PRILIMINERY AND CONTENTS.pdf Restricted Access | 1.65 MB | Adobe PDF | View/Open Request a copy | |
| C 1 - 14.pdf Restricted Access | 55.24 MB | Adobe PDF | View/Open Request a copy | |
| 15 - INDEX.pdf Restricted Access | 42 MB | Adobe PDF | View/Open Request a copy |
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